Abstract: Simulated annealing of multi-parameter optimization is the simulated annealing wave impedance inversion with some constraints, including S/N ratio, adjacent-channel correlation, deviation of initial model, and threshold value of reflection coefficient. The method can avoid the objective function value into a local extremum and has global optimum solutions. The principles of this method are introduced in this paper. The procedures are high-resolution processing, synthetic seismogram and horizon calibration, wavelet extraction, initial model establishment, simulated annealing inversion, and adjustment of multi-parameter restraints. The actual data processing indicates that: 1) compared to conventional wave impedance inversion, the method can improve the resolution of seismic data inversion; 2) the fault position in coherent slices of original data and coherent slices of wave impedance are coincide with that in structure maps, but the latter can provide a better criteria for fault interpretation than the former.

Key words: simulated annealing, wave impedance inversion, multi-parameter optimization, wavelet extraction, initial model;